Huge\u00a0solid angles up to 1.8\u00a0<\/strong>sr<\/strong><\/p>\n<\/li>\n

\n
SEM-EDX analysis with highest sensitivity<\/p>\n<\/li>\n<\/ul>\n<\/div>\n
<\/p>\n
\u5927\u7acb\u4f53\u89d2\u73af\u5f62SDD
\n\u9ad8\u8fbe1.8sr\u7684\u5de8\u5927\u7acb\u4f53\u89d2
\n\u80fd\u91cf\u5206\u8fa8\u7387\u4f4e\u81f3125 eV@Mn-K\u03b1
\n\u9ad8\u8ba1\u6570\u7387\u80fd\u529b\u9ad8\u8fbe4 Mcps\uff08ICR\uff09
\nXRF\u7cfb\u7edf\u4e2d\u654f\u611f\u6837\u54c1\u7684\u5feb\u901f\u5206\u6790\u53ca\u540c\u6b65\u52a0\u901f\u5668\u5e94\u7528
\n\u7075\u654f\u5ea6\u6700\u9ad8\u7684SEM-EDX\u5206\u6790<\/p>\n
$\"\"$ $\"\"$ <\/p>\n
$\"\"$ $\"\"$ <\/p>\n
$\"\"$ $\"\"$ <\/p>\n
Particulary advantageous in SEM-EDX<\/h3>\n
\n
\n
\n
EDX mappings with high-quality statistics can be performed in seconds<\/p>\n<\/li>\n
\n
Many times more signal compared to measurements with conventional SDDs<\/p>\n<\/li>\n
\n
Unmatched sensitivity up to 1 kcps \/ pA primary beam current<\/p>\n<\/li>\n<\/ul>\n
\n
\n
Light-element sensitivity down to Beryllium<\/p>\n<\/li>\n
\n
No shading by sample topography<\/p>\n<\/li>\n<\/ul>\n<\/div>\n
<\/p>\n
$\"\"$ $\"\"$ <\/p>\n
$\"\"$ \u00a0 $\"\"$ <\/p>\n
Fast XRF elemental mapping<\/h3>\n
\n
\n
\n
High collection efficiency leading to substantial reduction of the measurement time<\/p>\n<\/li>\n
\n
Light-proof version\u00a0 for light sensitive experiments (e.g. involving a light microscope)<\/p>\n<\/li>\n
\n
Fast analysis of biological samples at synchrotron nano-beam lines<\/p>\n<\/li>\n
\n
Increased sensitivity for trace element analysis in PIXE experiments<\/p>\n<\/li>\n<\/ul>\n<\/div>\n
$\"\"$ $\"\"$ <\/p>\n
4\u901a\u9053SDD<\/a>\n Racetrack SDD<\/a>\n SD3plus\u63a2\u6d4b\u5668<\/a>\n Silicon Drift Detector<\/a>\n \u5927\u7acb\u4f53\u89d2SDD<\/a>\n \u5927\u9762\u79efSDD\u63a2\u6d4b\u5668<\/a>\n \u7845\u6f02\u79fb\u63a2\u6d4b\u5668<\/a>\n \u9ad8\u541e\u5410\u91cfSDD<\/a><\/div>","protected":false},"excerpt":{"rendered":"
Silicon Drift Detector (SDD) Multi Cell SDDs The Unique Rococo Detector – a monolith <\/p>\n","protected":false},"author":19,"featured_media":200,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":[],"categories":[1],"tags":[11,8,6,3,9,7,4,10],"_links":{"self":[{"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/posts\/191"}],"collection":[{"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/users\/19"}],"replies":[{"embeddable":true,"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/comments?post=191"}],"version-history":[{"count":1,"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/posts\/191\/revisions"}],"predecessor-version":[{"id":207,"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/posts\/191\/revisions\/207"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/media\/200"}],"wp:attachment":[{"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/media?parent=191"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/categories?post=191"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.bihec.com\/pndetector\/wp-json\/wp\/v2\/tags?post=191"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}

Particulary advantageous in SEM-EDX<\/h3>\n\n\n\nEDX mappings with high-quality statistics can be performed in seconds<\/p>\n<\/li>\n\nMany times more signal compared to measurements with conventional SDDs<\/p>\n<\/li>\n