{"id":154,"date":"2023-07-21T13:35:11","date_gmt":"2023-07-21T05:35:11","guid":{"rendered":"https:\/\/www.bihec.com\/dataray\/?p=154"},"modified":"2023-07-21T13:35:11","modified_gmt":"2023-07-21T05:35:11","slug":"%e7%be%8e%e5%9b%bddataray-s-br2-si%e7%8b%ad%e7%bc%9d%e6%89%ab%e6%8f%8f%e5%bc%8f%e5%85%89%e6%96%91%e5%88%86%e6%9e%90%e4%bb%aa","status":"publish","type":"post","link":"https:\/\/www.bihec.com\/dataray\/%e7%be%8e%e5%9b%bddataray-s-br2-si%e7%8b%ad%e7%bc%9d%e6%89%ab%e6%8f%8f%e5%bc%8f%e5%85%89%e6%96%91%e5%88%86%e6%9e%90%e4%bb%aa\/","title":{"rendered":"\u7f8e\u56fdDATARAY S-BR2-Si\u72ed\u7f1d\u626b\u63cf\u5f0f\u5149\u6591\u5206\u6790\u4eea,Beam’R2 \u5149\u6591\u5206\u6790\u4eea"},"content":{"rendered":"
\u7f8e\u56fdDATARAY S-BR2-Si<\/a>\u72ed\u7f1d\u626b\u63cf\u5f0f\u5149\u6591\u5206\u6790\u4eea<\/a>,Beam’R2 \u5149\u6591\u5206\u6790\u4eea<\/a><\/p>\n \u7f8e\u56fdDATARAY<\/a> \u751f\u4ea7\u4e24\u79cd\u7c7b\u578b\u7684\u626b\u63cf\u72ed\u7f1d\u5149\u675f\u5206\u6790\u4eea\uff1aBeamMap \u7cfb\u5217\uff0c\u63d0\u4f9b\u5b9e\u65f6 M\u00b2\u3001\u53d1\u6563\u3001\u805a\u7126\u548c\u5bf9\u51c6\u7ba1\u7406\uff0c\u4ee5\u53ca Beam’R \u7cfb\u5217\uff0c \u7d27\u51d1\u4e14\u7cbe\u786e\u7684\u5149\u675f\u5206\u6790\uff0c\u6240\u6709\u7684\u72ed\u7f1d\u626b\u63cf\u5149\u675f\u5206\u6790\u4eea\u5747\u914d\u5907 Si\u3001Ge \u548c InGaAs \u63a2\u6d4b\u5668\uff0c\u8986\u76d6\u6ce2\u957f\u4ece 190 nm \u5230 2500 nm\u3002<\/p>\n \u7f8e\u56fdDATARAY S-BR2-Si\u72ed\u7f1d\u626b\u63cf\u5f0f\u5149\u6591\u5206\u6790\u4eea,Beam’R2 \u5149\u6591\u5206\u6790\u4eea \u7f8e\u56fdDATARAY \u751f\u4ea7\u4e24\u79cd\u7c7b\u578b\u7684\u626b\u63cf\u72ed\u7f1d\u5149\u675f\u5206\u6790\u4eea\uff1aBeamMap \u7cfb\u5217\uff0c\u63d0\u4f9b\u5b9e <\/p>\n","protected":false},"author":29,"featured_media":155,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_vp_format_video_url":"","_vp_image_focal_point":[]},"categories":[3],"tags":[5,17,8,6,4,9,11,10,7,16],"yoast_head":"\n\u7f8e\u56fdDATARAY<\/a> S-BR2-Si XY \u626b\u63cf\u72ed\u7f1d\u7cfb\u7edf\uff0c190 \u81f3 2500* nm<\/span><\/h2>\n
\u7aef\u53e3\u4f9b\u7535\u7684 USB 2.0<\/span><\/h3>\n
\u7279\u5f81<\/span><\/h4>\n
\n
\u5e94\u7528\u9886\u57df<\/span><\/h4>\n
\n
\n\n
\n \nSpecification<\/th>\n Detail<\/th>\n<\/tr>\n<\/thead>\n \n Wavelength<\/td>\n Si detector: 190 to 1150 nm
\nInGaAs detector: 650 to 1800 nm
\nSi + InGaAs detectors: 190 to 1800 nm
\nSi + InGaAs (extended) detectors: 190 to 2300 or 2500 nm<\/td>\n<\/tr>\n\n Scanned Beam Diameters<\/td>\n Si detector: 5 \u00b5m to 4 mm\u201a to 2 \u00b5m in Knife-Edge mode
\nInGaAs detector: 10 \u00b5m to 3 mm\u201a to 2 \u00b5m in Knife-Edge mode
\nInGaAs (extended) detector: 10 \u00b5m to 2 mm\u201a to 2 \u00b5m in Knife-Edge mode<\/td>\n<\/tr>\n\n Beam Waist Diameter Measurement<\/td>\n Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
\n1\/e\u00b2 (13.5%) width
\nUser selectable % of peak
\nKnife-Edge mode for very small beam<\/td>\n<\/tr>\n\n Measured Sources<\/td>\n CW; Pulsed lasers\u201a \u03a6 \u00b5m \u2265 [500\/(PRR in kHz)]<\/td>\n<\/tr>\n \n Resolution Accuracy<\/td>\n 0.1 \u00b5m or 0.05% of scan range
\n\u00b1 < 2% \u00b1 = 0.5 \u00b5m<\/td>\n<\/tr>\n\n Maximum Power & Irradiance<\/td>\n 1 W Total & 0.5 mW\/\u00b5m\u00b2<\/td>\n<\/tr>\n \n Gain Range<\/td>\n 1\u201a000:1 Switched; 4\u201a096:1 ADC range<\/td>\n<\/tr>\n \n Displayed Graphics<\/td>\n X-Y Position & Profiles\u201a Zoom x1 to x16<\/td>\n<\/tr>\n \n Update Rate<\/td>\n ~5 Hz<\/td>\n<\/tr>\n \n Pass\/Fail Display<\/td>\n On-screen selectable Pass\/Fail colors. Ideal for QA & Production.<\/td>\n<\/tr>\n \n Averaging<\/td>\n User selectable running average (1 to 8 samples)<\/td>\n<\/tr>\n \n Statistics<\/td>\n Min.\u201a Max.\u201a Mean\u201a Standard Deviation
\nLog data over extended periods<\/td>\n<\/tr>\n\n XY Profile & Centroid<\/td>\n Beam Wander display and logging<\/td>\n<\/tr>\n \n Minimum PC Requirements<\/td>\n Windows, 2 GB RAM, USB 2.0\/3.0 port<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n