美國DATARAY BMS2-CM4-Si-5光斑分析儀,光束輪廓分析儀
美國DATARAY 生產兩種類型的掃描狹縫光束分析儀：BeamMap 系列，提供實時 M2、發散、聚焦和對準管理，以及 Beam’R 系列， 緊湊且精確的光束分析，所有的狹縫掃描光束分析儀均配備 Si、Ge 和 InGaAs 探測器，覆蓋波長從 190 nm 到 2500 nm。
美國DATARAY Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0
S-BMS2-CM4-Si-5
Features
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Beam diameters ~100 μm to ~3 mm (1.5 mm with extended InGaAs)
- 25 μm slit pairs with Si; 0.1 to 2 μm sampling intervals
- 50 μm slit pairs with InGaAs; 0.1 to 2 μm sampling intervals
- Real-time?±1 mr real-time Divergence and Pointing measurement accuracy
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 μm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time?multiple Z plane scanning slit system
- Real-time?XYZ profiles, Focus position
- Real-time?M2, Divergence, Collimation, Alignment
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW;?Pulsed lasers, Φ μm ≥ [500/(PRR in kHz)]
- M2 measurement with available M2DU stage
* model-dependent
