20kev 二次離子質譜SIMS聚焦離子源 表面分析儀器樣品清潔離子槍離子源Model 1420

Nonsequitur 離子槍離子源Model 1420 Design Features

  • Adjustable spot size ≥ 5um for spatially defined sputtering or implantation
  • Emission regulated bombardment provides stable ion current
  • Continuously variable beam energy 5kV to 20kV
  • Dual octupole for beam scanning and astigmatism correction
  • Pre-objective scanning for reduced spot size
  • No direct filament to sample line of sight to avoid sample contamination
  • Customer replaceable filaments and beam trimming apertures
  • Dual filaments provide operational backup in case of filament end of life
  • All UHV compatible and etch resistant materials used in fabrication
  • Differential pumping to minimize main chamber gas load
  • Operates over the range of inert gases and Nitrogen
  • 可調點大小≥ 5um,用于空間定義的濺射或植入
    排放調節轟炸提供穩定的離子電流
    連續可變光束能量 5kV 至 20kV
    用于光束掃描和散光校正的雙八角形
    目標前掃描,以減少點大小
    沒有直接燈絲到樣品視線,以避免樣品污染
    客戶可更換燈絲和光束修剪孔徑
    雙絲在燈絲壽命結束時提供操作備份
    制造中使用的所有超高壓兼容和蝕刻耐藥材料
    差分泵送,以盡量減少主室氣體負荷
    在惰性氣體和氮氣范圍內工作

Nonsequitur 離子槍離子源Model 1420 選配

  • Thoria coated Iridium filaments for operation with Oxygen
  • Variable aperture for spot size down to 1um
  • Blanking plates for fast beam pulsing
  • Alkali metal source for operation with Cs, Li, Na, K etc
  • Source oven to permit production of ions of evaporable materials
  • Source with integral Wien filter
  • 托里亞涂層虹膜絲與氧氣操作
    可變光圈的斑點大小下降到1um
    用于快速光束脈動的空白板
    堿金屬源與 Cs、Li、Na、K 等一起運行
    源烤箱,允許生產離子的可蒸發材料
    具有積分維恩過濾器的源

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