Silicon Drift Detector (SDD) Multi Cell SDDs The Unique Rococo Detector – a monolithic annular 4-channel SDD for XRF and EDX 用于XRF和EDX的單片環形4通道SDD
When extreme solid angles are needed to detect the most available signal, the Rococo2 and Rococo3 detectors are the best choice you can make.
Due to their special geometry, these monolithic annular?4-channel SDDs?with the exciting beam through the hole in the middle of the chip can be placed extremely close to the sample, resulting in huge solid angle values up to 1.8 sr, and in a tremendous reduction of measurement time. At the same time, the annular detector geometry makes possible a 3D-visualisation of the sample without any shadowing effects.
當需要極端立體角來檢測最可用的信號時，Rococo2和Rococo3探測器是您的最佳選擇。
由于其特殊的幾何形狀，這些具有通過芯片中間孔的激勵光束的單片環形4通道SDD可以放置在非常靠近樣品的位置，從而產生高達1.8sr的巨大立體角值，并大大縮短了測量時間。同時，環形探測器的幾何形狀使樣品的3D可視化成為可能，而沒有任何陰影效應。
Annular SDDs with a Huge Solid Angle
Huge?solid angles up to 1.8?sr
Energy resolution down to?125 eV?@ Mn-Kα
High count rate capability up to?4?Mcps?(ICR)
Fast analysis of sensitive samples in XRF-systems and synchrotron applications
SEM-EDX analysis with highest sensitivity
大立體角環形SDD
高達1.8sr的巨大立體角
能量分辨率低至125 eV@Mn-Kα
高計數率能力高達4 Mcps（ICR）
XRF系統中敏感樣品的快速分析及同步加速器應用
靈敏度最高的SEM-EDX分析
Particulary advantageous in SEM-EDX
EDX mappings with high-quality statistics can be performed in seconds
Many times more signal compared to measurements with conventional SDDs
Unmatched sensitivity up to 1 kcps / pA primary beam current
Light-element sensitivity down to Beryllium
No shading by sample topography
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Fast XRF elemental mapping
High collection efficiency leading to substantial reduction of the measurement time
Light-proof version? for light sensitive experiments (e.g. involving a light microscope)
Fast analysis of biological samples at synchrotron nano-beam lines
Increased sensitivity for trace element analysis in PIXE experiments
