Silicon Drift Detector (SDD) for High End Applications: Energy resolution at the theoretical limit 高端應用：理論極限下的能量分辨率

Silicon Drift Detector (SDD) for High End Applications: Energy resolution at the theoretical limit 高端應用：理論極限下的能量分辨率

When ultimate spectral resolution is required, you should choose the highest performance available on the market. Based on our well-proven SDD droplet technology, our SD3plus?detectors use the latest chip-integrated FET design to push the performance towards the physical limits.

基于我們久經考驗的SDD液滴技術，我們的SD3plus探測器使用最新的芯片集成FET設計，將性能推向物理極限。

The SD3plus?Detector Performance

  • The ultra-low signal capacitances of the chip-integrated JFET offer?outstanding?low?noise?performance

  • Unmatched energy resolution values down to?121 eV?@ Mn-Kα?and?36 eV?@ C-K

  • The outstanding energy resolution of our detector is especially apparent in?light?element?detection where detector noise plays the largest role

  • Light element detection with superior performance can be achieved if SDDs are used as?windowless detectors?in high vacuum applications

  • Even?Lithium K-line?and?Aluminum L-line?can be well measured

  • The outstanding energy resolutions of the?SD3plus?detectors offer accurate quantitative analysis even for very low energy M- and L-lines and weak signals in low kV electron microscopy

  • The superior? performance at warmer temperatures enables new possibilities for applications with low cooling power consumption; light element detection is possible even at room temperature

SD3plus探測器性能
芯片集成JFET的超低信號電容提供了卓越的低噪聲性能
能量分辨率值低至121 eV@Mn-Kα和36 eV@C-K
我們的探測器卓越的能量分辨率在探測器噪聲起最大作用的輕元件探測中尤為明顯
如果在高真空應用中使用SDD作為無窗檢測器，則可以實現具有優異性能的輕元件檢測
即使是鋰K線和鋁L線也可以很好地測量
SD3plus探測器卓越的能量分辨率提供了精確的定量分析，即使是在低千伏電子顯微鏡中對極低能量的M-和L-線以及弱信號也是如此
在更高溫度下的卓越性能為低冷卻功耗的應用提供了新的可能性；即使在室溫下也可以進行光元件檢測


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