Silicon Drift Detector (SDD) Racetrack SDDs: For large solid angle in Microanalysis in TEM 用于TEM中的微分析中的大立體角
There is a limitation if only the active area of the SDD is increased. Therefore PNDetector invented the so called Racetrack chip structure. These SDDs make use of an oval shaped active area. Therefore, they can be placed extremely close to the sample even in applications where the available space is restricted. This leads to largely increased solid angles.
如果僅增加SDD的活動(dòng)區(qū)域，則存在限制。因此PNDetector發(fā)明了Racetrack芯片結(jié)構(gòu)。這些SDD利用了一個(gè)橢圓形的活動(dòng)區(qū)域。因此，即使在可用空間有限的應(yīng)用中，它們也可以放置在離樣品非常近的位置。這導(dǎo)致立體角大大增加。
The Specific Oval Shaped SDD Series named Racetrack
High resolution spectroscopy down to?126 eV?@ Mn Kα, -30 °C
Extreme close proximity to the sample with solid angles exceeding 1 sr
Huge solid angles up to 2 sr are possible with dual configurations in TEM
Mounted on a compact housing comprising non-magnetic materials
Mostly used in “windowless” configuration – gives the highest detection efficiency for light elements
特殊的橢圓形SDD系列Racetrack
在Mn Kα，-30°C時(shí)，高分辨率光譜低至126 eV
與立體角超過1 sr的樣品極為接近
在TEM中使用雙配置可以獲得高達(dá)2sr的巨大立體角
安裝在由非磁性材料組成的緊湊型外殼上
主要用于“無窗”配置–為光元件提供最高的檢測(cè)效率
