直徑公差:25.4 mm+0/-0.2 mm,75.0和100.0 mm+0/-0.3 mm
厚度公差:+/-0.2 mm
表面光潔度:S&D 60/40
CA:90%中心
光譜測量
每個窗口提供室溫和法向入射角下的光譜曲線。
非標準光譜測量(1-4個)
Art no | Description | Substrate | min Tavg % |
716.700.640 | BBAR-3000-5000 nm ?25.4×0.5 mm | Si | 97% |
716.700.641 | BBAR-3000-5000 nm ?25.4×1.0 mm | Si | 97% |
716.700.642 | BBAR-3000-5000 nm ?100.0×0.5 mm | Si | 97% |
716.700.643 | BBAR-3000-5000 nm ?100.0×1.0 mm | Si | 97% |
716.700.650 | BBAR-8000-12000 nm ?25.4×0.5 mm | Si | 88% |
716.700.651 | BBAR-8000-12000 nm ?25.4×1.0 mm | Si | 88% |
716.700.652 | BBAR-8000-12000 nm ?100.0×0.5 mm | Si | 88% |
716.700.653 | BBAR-8000-12000 nm ?100.0×1.0 mm | Si | 88% |
716.700.660 | BBAR-2500-14000 nm ?25.4×0.5 mm | Si | 3-5 μm 90 % 8-12 μm 80 % |
716.700.661 | BBAR-2500-14000 nm ?25.4×1.0 mm | Si | 3-5 μm 90 % 8-12 μm 80 % |
716.700.662 | BBAR-2500-14000 nm ?100.0×0.5 mm | Si | 3-5 μm 90 % 8-12 μm 80 % |
716.700.663 | BBAR-2500-14000 nm ?100.0×1.0 mm | Si | 3-5 μm 90 % 8-12 μm 80 % |